DIN41612 development and diagnostic card

Universal DIN41612 card optimized for development for NenoVision.

DIN41612 development and diagnostic card

Universal DIN41612 card optimized for development for NenoVision.

Development of a universal development and diagnostic card for NenoVision.

NenoVision fabricate a unique atomic force microscope by name LiteScope™ designed for easy integration into various scanning electron microscopes, allowing in-situ collerative characterization of the sample in the nanoscale.

Our task in cooperation with NenoVision was to development of a universal diagnostic card for new NenoBox 2.0 computer unit.

The diagnostic card with DIN 41612 connectors has been designed with an emphasis on precise shielding of sensitive signals and durable insulation properties. This was achieved using a 6-layer PCB and precise “live signal” guidance and shielding. The card enables bridging and very versatile control and monitoring of signal paths during diagnostics and development of new systems for the NenoBox 2.0 computer unit, which controls NenoVision’s Atomic-Force-Microscopy.

The card allows disconnection, bridging of universal signal paths and monitoring using pin-headers or BNC connectors. Thanks to the compact and ergonomically placed jumper system, the card is an ideal tool for disconnecting signal paths or connecting the shielding of critical sections in the development of new systems.

Development and diagnostic card

Precise shielding and signals control

Shielding of all layers.

Universal design for development with DIN41612 standard.

High current design and insulation properties.